Recently, experts and committee members from the Instrumentation Professional Certification Committee of the China Engineering Education Accreditation Association, along with professors from nearly 20 universities including Harbin Institute of Technology, visited WISDOM. WISDOM’s General Manager, Xie Jianguo, accompanied them during the visit.
The experts and professors visited the company’s digital exhibition hall, testing center, and intelligent factory. Through the visit, they gained a deeper understanding of WISDOM’s development history, corporate culture, business areas, and products. They particularly commended WISDOM’s achievements in talent development, innovation leadership, and intelligent manufacturing, as well as the company’s “recruit-train-employ-retain” talent mechanism and broad career development platform. During the discussions, the professors expressed their pleasure at seeing their students’ rapid growth and development at WISDOM and expressed hopes to deepen industry-university collaboration to provide more outstanding talent for the company.
Tour of the Company"s Digital Exhibition Hall
WISDOM has long established stable and close industry-university-research collaborations with multiple research institutions and universities, developing a distinctive "dual-career development path" and "dual-career mentor system," integrating personal career growth with the company’s development. This approach continues to enhance employees" sense of achievement, fulfillment, and belonging.
Looking ahead, WISDOM will further strengthen its cooperation with universities, promoting deeper integration of industry, academia, and research. The company will also provide more positions for talented individuals and increase recruitment efforts to ensure ample intellectual support for WISDOM’s sustainable, stable, fast, and high-quality development, as well as its "doubling" goals. Additionally, WISDOM will leverage its technological leadership to offer customers superior products and system solutions, creating greater value.